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TEST CHARTS   SINE PATTERNS   BARCODE STANDARDS   SIZE / POSITION SCALES
AND GRIDS
Optical Resolution Test Charts for calibration and resolution testing of microfilm cameras, video systems, optical scanners, FBI IAFIS systems, and ISO Electronic Imaging. When used in reduction systems, these charts can easily test the optical resolution of a system down to the sub-micrometer range. Resolution Targets
USAF 1951
  Sine transmission and reflection charts for test of optical resolution and MTF (modulation transfer function). Sinusoidal Arrays   Barcode calibration test cards used to measure the accuracy of barcode verifiers in the ANSI - ISO grading of symbology. Cards are available to test decodability, modulation, defects and contrast in UPC, EAN , Code 39, Code 128 and other symbologies. Code 39   Micrometer test scales and grids for use in calibration of microscopes, comparators and other measuring devices. Microscopy
/ Microscope Slides
Scanner - Video Targets   Single Frequency
Gratings
  Code 128   Vision / Image Analysis
Enhanced ISO
Digital Targets
  Composite   CCSV-1   Grids
SFR / OECF
ISO 16067 / MTF Targets
  Arrays   EAN/UPC   Line / Dot Size
                    Scales
                     
RETICULES SLITS APERTURES   ENCODERS   CONTINUOUS TONE / GRAY   RONCHI RULINGS
Reticles (aka reticules or graticles or graticles) can take many forms, but most often are used as crosshairs or scales. Reticles   Optical encoders can be either linear of rotary and made from glass, Mylar, polyester, photo film, or various metals. Spoke widths can be as small as one micrometer and smaller, if required. Film Linear
/ Rotary
  Step Tablets
Color Charts
  Chrome on Opal /
Optical Glass
Glass Slits   Glass linear
/ Rotary
  Patches   Gratings
Pinholes       ISO Grey Charts   Clear Mylar Film
      Density Steps   Reflective Paper
                     
                     
NIST TRACEABLE
CALIBRATION SERVICE
  CUSTOM MANUFACTURING   PHOTO MASK   DIGITAL IMAGE ANALYSIS
Linear measurements, optical reflectance and transmission reports, traceable to NIST (National Institute of Standards and Technology (formerly NBS (National Bureau of Standards).     Electromask Pattern Generators and other semiconductor industry related equipment is used to produce chrome on glass precision patterns with sub-micrometer images. Special substrates as well as standard sodalime, bk7, crown glass, sapphire, fused silica and quartz are used. Electro Optical
Components
  Semiconductor masks are useful as precision optical images and can be used to align instruments, test optical resolution, serve as stage micrometers, and test the accuracy of measuring stages. Mask Making
Services
  Imatest software for digital imaging analysis IMAGING GAUGE
    Optical Imaging   MEMS   Imatest Target Replacement
    Photo Lithogaphy       Image Science Associates
Target Replacement