Home Page | Account | Order Status | Search | Product List | Basket | Contacts | Quick Catalog
Test Targets
Sinusoidal Arrays
Sinusoidal Gratings
Composite Sinusoidal Gratings
Stage Micrometers
Image Analysis Standards
Accu-PlaceTM Machine Vision
Reticles, Graticules, Slits & Pinholes
Ronchi Rulings
Gray Scales & Density Reference Charts
Barcode Standards
Encoder Scales
Catalog (PDF)
| 		Information
Material Image Information
Material Substrate Information
Contact us
Sales Contacts
Techical Documents
Catalog (PDF)
Terms and Conditions
Checkout
Sign In


Your basket is empty

Resolution Test Charts
Sinusoidal MTF Optical Test Chart
Stage Micrometer Calibration Scale Grid
Round-Reticules / Slits / Apertures
Continuous Tone Gray Contrast Chart
Ronchi Rulings Precision Optical Grating
Bar Code Verifier Calibration Standards
Encoders
NIST Traceable Calibration
Photo Mask
Custom Manufacturing
Imatest
Microsoft Webcam Image Quality Test Chart
Find Products
Keyword:

We now accept online orders

Featured Products
and News
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 

   Test Charts   Sine Patterns   Barcode Standards
  Optical Resolution Test Charts for calibration and resolution testing of microfilm cameras, video systems, optical scanners, FBI IAFIS systems, and ISO Electronic Imaging. When used in reduction systems, these charts can easily test the optical resolution of a system down to the sub-micrometer range. Resolution Targets
USAF 1951		   Sine transmission and reflection charts for test of optical resolution and MTF (modulation transfer function). Sinusoidal Arrays   Barcode calibration test cards used to measure the accuracy of barcode verifiers in the ANSI - ISO grading of symbology. Cards are available to test decodability, modulation, defects and contrast in UPC, EAN , Code 39, Code 128 and other symbologies. Code 39
  Scanner - Video Targets   Single Frequency
Gratings		   Code 128
  Enhanced ISO
Digital Targets		   Composite   CCSV-1
  SFR / OECF
ISO 16067 / MTF Targets		   Arrays   EAN/UPC
                 
                 
  Size / Position Scales
and Grids 		  Reticules / Slits / Apertures   Encoders
  Micrometer test scales and grids for use in calibration of microscopes, comparators and other measuring devices. Microscopy
/ Microscope Slides 		  Reticles (aka reticules or graticles or graticles) can take many forms, but most often are used as crosshairs or scales. Reticles   Optical encoders can be either linear of rotary and made from glass, Mylar, polyester, photo film, or various metals. Spoke widths can be as small as one micrometer and smaller, if required. Film Linear
/ Rotary
  Vision / Image Analysis   Glass Slits   Glass linear
/ Rotary
  Grids   Pinholes    
  Line / Dot Size    
    Scales        
             
  Continuous Tone / Gray   Ronchi Rulings   NIST Calibration
Services
  Step Tablets   Chrome on Opal /
Optical Glass		   Linear measurements, optical reflectance and transmission reports, traceable to NIST (National Institute of Standards and Technology (formerly NBS (National Bureau of Standards).  
  Patches   Gratings    
  ISO Grey Charts   Clear Mylar Film    
  Density Steps   Reflective Paper    
             
             
  Custom Manufacturing   Photo Mask   Image Analysis
Software and Services
  Electromask Pattern Generators and other semiconductor industry related equipment is used to produce chrome on glass precision patterns with sub-micrometer images. Special substrates as well as standard sodalime, bk7, crown glass, sapphire, fused silica and quartz are used. Electro Optical
Components		   Semiconductor masks are useful as precision optical images and can be used to align instruments, test optical resolution, serve as stage micrometers, and test the accuracy of measuring stages. Mask Making
Services		   Imatest software for digital imaging analysis Imatest
  Optical Imaging   MEMS   API 3.0
  Photo Lithogaphy       Master 3.0
          Studio 3.0
                 
                 
2-cycle Targets | 2D Barcodes | Accu Place | IAFIS | AIIM | AIM DPMV | ANSI Targets | Aperture | ASTM Grain Standard | AutoCAD | Barcode | Barcode Labels | Barcode Standards | Bookland | Calibration Services | Calibration Standards | CCSV-1 | Chopper | Chrome on Glass | code 128 | code 39 | Color Targets | Contrast | Contrast Transfer Function | Copier Test Chart | Cover Glass | Crosshair | Color Targets | CTF | Custom Optical Components | Densitometer | Density | Density Wedges | Diffusion | Digital Camera Test |Digital Cine Test Chart | Dimensional Stability | Distortion | Divided Scales | D-log E | Dot Standards | EAN | EFTS | EIA Charts   Electron Beam | Encoder | EPS Files | Etched Glass | Extended Code Coupon | Eyepiece | FBI IAFIS | FBI Test Chart SIQT | Film Encoder | Film Masters | Filter Factor | Glass Encoder | Graticules | Grating | Grey Scale | Grids | Ground Glass | Halftone | HDTY Test Chart | High Contrast Image | High Resolution | Holography | IEEE Test Targets | Illumination | Image Analysis | Imatest Software | Interferometer | IQS Test | ISBN | ISMN | ISO 12233 | ISO 14524 | ISO 16067 | ISO 21550 Dynamic Range | ISO Charts | ISO Knife Edge Target | Large Area Chart | Laser | Latent Image | Limit of Resolution | Linear Barcodes | Linear Encoder | Low Contrast Image | Magnification
Mask | Mask Making | MEMS | Microdesitometer |
Microelectronic | Microfiche | Microfilm | Microline | Micro Machine | Micrometers | Microminiaturization | Microphotography | Microscope Calibration Standard | Microscopy Standards | Modulation Transfer Function | Moire | Morphometric Image Analysis | MTF | MTF Test Chart | N.I.S.T. | National Bureau of Standards | National Institute of Standards and Technology | NBS | NBS Charts | Negative | Neutral Density | OECF Test Chart | Opal Glass | Optical | Optical Alignment | Optical Aperture | Optical Density | Optical Glass | Opto Comp | Percent Reflection | Pick and Place | Photoemulsion | Photoetch | Photofabrication | Photofilm | Photolithography | Photomasks | Photometric | Photoplate | Photopolymer | Photoresist | Photosensitive | Pick and Place | Pinhole | Polished | Positive | Precision Artwork | Projection | QA-62 | QA-71 | QA-72 | QA-77 | Quality Assurance | ISO 15416 | ANSI X3.182		   RIT Alphanumeric | Random Test Chart | Random Test Pattern | Reflectance | Reflection Chart | Refraction | Resolution | Resolution Test Target | Resolving Power | Reticle | Reticule | Robotic | Ronchi Ruling | Rotary Encoder | Sayce Target | Scales | Scanner Target | Screen Dot | Secondary Certification | Sensitometric | SFR Test Chart | Shipping Container Barcodes | Silver Halide | Sine Arrays | Sine Patterns | Sinusoids | Slant Edge Test Chart | Slits | SMT | Software | SSC | Stage Mapping | Stage Micrometers | Stage Rulers | Star Target | Step and Repeat | Step Tablets | Step Wedges | Stepper Reticle | T-20 | Test Components | Transmission Chart | Transparency | UCC | UPC-A | UPC-E | USAF 1951 | Video Resolution | Video Test Chart | Vision | Vision System | Video System Standards

Home Page | Account | Search | Product List | Basket | Contact Us | Technical Documents | Sales Contacts



Ecommerce Shopping Cart Software by Miva Merchant